DocumentCode
2244516
Title
Influence of partial discharges on void gas pressure
Author
Gjaerde, A.C. ; Sletbak, J.
Author_Institution
Electr. Power Res. Inst., Trondheim, Norway
fYear
1993
fDate
28-30 Sep 1993
Firstpage
119
Lastpage
120
Abstract
The development of void gas pressure has been measured at different levels of voltage and thermal stress. The void gas pressure typically exhibits a fluctuating behaviour in the beginning of ageing and then subsequently decreases at a constant rate that increases for increasing voltage stress. It is larger at 50°C than at room temperature. A characteristic pd-pattern was observed to develop after a certain ageing time dependent on the temperature level. The characteristic pd-pattern could to some extent be explained as an effect of indirect interaction
Keywords
ageing; partial discharges; voids (solid); 50 C; ageing; fluctuations; indirect interaction; partial discharges; thermal stress; void gas pressure; voltage stress;
fLanguage
English
Publisher
iet
Conference_Titel
Partial Discharge, 1993., International Conference on
Conference_Location
Canterbury
Print_ISBN
0-85296-579-6
Type
conf
Filename
341410
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