Title :
Single Event Effects Characterization of Maxwell 7846B DAC
Author :
Stone, Stephen E. ; Lombardi, Robert E. ; Seehra, Surinder S. ; Likar, Justin J. ; Begovic, Jasmin ; Herschitz, Roman
Author_Institution :
Lockheed Martin Space Syst. Co., Newtown, PA, USA
Abstract :
Heavy ion test results indicate that the Maxwell 7846B 16 Bit DAC is susceptible to SET and SEU in the form of stable level changes at the device output.
Keywords :
digital-analogue conversion; integrated circuit testing; Maxwell 7846B DAC; SET; SEU; heavy ion testing; single event effects characterization; word length 16 bit; Aerospace electronics; Companies; Gold; Latches; Oscilloscopes; Testing; Transient analysis;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-2730-5
DOI :
10.1109/REDW.2012.6353713
