• DocumentCode
    2244802
  • Title

    Single Event Effects Characterization of Maxwell 7846B DAC

  • Author

    Stone, Stephen E. ; Lombardi, Robert E. ; Seehra, Surinder S. ; Likar, Justin J. ; Begovic, Jasmin ; Herschitz, Roman

  • Author_Institution
    Lockheed Martin Space Syst. Co., Newtown, PA, USA
  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Heavy ion test results indicate that the Maxwell 7846B 16 Bit DAC is susceptible to SET and SEU in the form of stable level changes at the device output.
  • Keywords
    digital-analogue conversion; integrated circuit testing; Maxwell 7846B DAC; SET; SEU; heavy ion testing; single event effects characterization; word length 16 bit; Aerospace electronics; Companies; Gold; Latches; Oscilloscopes; Testing; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2012 IEEE
  • Conference_Location
    Tucson, AZ
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4673-2730-5
  • Type

    conf

  • DOI
    10.1109/REDW.2012.6353713
  • Filename
    6353713
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2244802