Title :
Neutron-Induced Soft Errors in Graphic Processing Units
Author :
Rech, P. ; Aguiar, C. ; Ferreira, R. ; Silvestri, M. ; Griffoni, A. ; Frost, C. ; Carro, L.
Author_Institution :
Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Abstract :
This paper presents and analyzes the results of neutron experiments on 40nm Graphic Processing Units. We have measured the internal memory resources cross sections, and define a new threads cross section to characterize the computing units sensitivity to radiation. We experimentally evaluate the matrix multiplication application error rate and built an analytical model to predict algorithms neutron-induced failures.
Keywords :
graphics processing units; matrix multiplication; graphic processing unit; internal memory resources cross section; matrix multiplication application error rate; neutron-induced failure; neutron-induced soft error; Error analysis; Graphics processing units; Instruction sets; Neutrons; Registers; Sensitivity; Single event upset;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-2730-5
DOI :
10.1109/REDW.2012.6353714
