Title :
Design Considerations of Ultralow-Voltage Self-Calibrated SAR ADC
Author :
Xiaoyang Wang ; Hai Huang ; Qiang Li
Author_Institution :
Integrated Syst. Lab., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
This brief presents a 0.5-V 11-bit successive approximation register analog-to-digital converter (ADC) with a focus on self-calibration at a low supply voltage. The relationships among the noise of comparators, the resolution of a calibration digitalto-analog converter (DAC), and the overall ADC performance are studied. Analysis shows that the nonlinearity of a calibration DAC and a coupling capacitor has an insignificant effect. An ultralow-leakage switch is also described, and an improved process of measuring mismatch is proposed to alleviate the charge injection of a sampling switch. Fabricated in the 0.13-μm CMOS with an active area of 0.868 mm2, the ADC achieves a signal-to-noise-plus-distortion ratio (SNDR) of 62.12 dB and a spurious-free dynamic range of 73.03 dB at a 500-kS/s sampling rate. The power consumption is 39.9 μW.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; digital-analogue conversion; low-power electronics; CMOS technology; digital-to-analog converter; low supply voltage; power 39.9 muW; self-calibration; signal-to-noise-plus-distortion ratio; size 0.13 mum; successive approximation register analog-to-digital converter; ultralow-voltage self-calibrated SAR ADC; voltage 0.5 V; Arrays; Calibration; Capacitors; Couplings; Noise; Switches; Voltage measurement; ADC; Analog-to-digital converters (ADCs); SAR; high resolution; low power; self-calibration; successive approximation register (SAR); ultra low voltage; ultralow voltage;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2014.2387654