• DocumentCode
    2245156
  • Title

    Low-Energy Proton Testing Using the Boeing Radiation Effects Laboratory 2.2 MeV Dynamitron

  • Author

    Wert, Jerry ; Russell, Dennis ; Bartholet, Bill ; Clemen, Mark ; Koehn, Jason ; Schasteen, Bill ; Cannon, Ethan ; Cabanas-Holmen, Manuel

  • Author_Institution
    Boeing Co., Seattle, WA, USA
  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper describes the use of the BREL Dynamitron accelerator for low-energy (≤ 2MeV) single event effects testing of semiconductor devices. A description of the Dynamitron and test data shall be given.
  • Keywords
    radiation hardening (electronics); semiconductor device testing; BREL dynamitron accelerator; Boeing radiation effect laboratory dynamitron; electron volt energy 2.2 MeV; low-energy proton testing; low-energy single event effect testing; semiconductor devices; test data; Companies; Electronic mail; Particle beams; Protons; Random access memory; Testing; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2012 IEEE
  • Conference_Location
    Tucson, AZ
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4673-2730-5
  • Type

    conf

  • DOI
    10.1109/REDW.2012.6353727
  • Filename
    6353727
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2245156