Title :
Radiation Test Results on COTS and Non-COTS Electronic Devices for NASA Johnson Space Center Spaceflight Projects
Author :
Allums, K.K. ; ONeill, P.M. ; Reddell, B.D. ; Bailey, C.R. ; Nguyen, K.V.
Abstract :
This paper reports the results of recent proton Single Event Effect (SEE) testing on a variety of COTS and non-COTs electronic devices and assemblies tested for the International Space Station (ISS) and other spaceflight programs.
Keywords :
assembling; electron device testing; radiation hardening (electronics); space vehicle electronics; COTS electronic devices; ISS; International Space Station; NASA Johnson space center spaceflight projects; nonCOTS electronic devices; proton single event effect testing; radiation test; Hardware; Low earth orbit satellites; NASA; Portable computers; Protons; Space vehicles; Testing;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-2730-5
DOI :
10.1109/REDW.2012.6353731
