• DocumentCode
    2245246
  • Title

    Radiation Test Results on COTS and Non-COTS Electronic Devices for NASA Johnson Space Center Spaceflight Projects

  • Author

    Allums, K.K. ; ONeill, P.M. ; Reddell, B.D. ; Bailey, C.R. ; Nguyen, K.V.

  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    This paper reports the results of recent proton Single Event Effect (SEE) testing on a variety of COTS and non-COTs electronic devices and assemblies tested for the International Space Station (ISS) and other spaceflight programs.
  • Keywords
    assembling; electron device testing; radiation hardening (electronics); space vehicle electronics; COTS electronic devices; ISS; International Space Station; NASA Johnson space center spaceflight projects; nonCOTS electronic devices; proton single event effect testing; radiation test; Hardware; Low earth orbit satellites; NASA; Portable computers; Protons; Space vehicles; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2012 IEEE
  • Conference_Location
    Tucson, AZ
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4673-2730-5
  • Type

    conf

  • DOI
    10.1109/REDW.2012.6353731
  • Filename
    6353731
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2245246