Title :
Full field and quasi-TEM time domain numerical analysis of coupled microstrip circuits
Author :
Lo Vetri, J. ; Mardare, D. ; Elsherbeni, A.Z. ; Smith, C.E.
Author_Institution :
Dept. of Electr. Eng., Univ. of Western Ontario, London, Ont., Canada
Abstract :
Both full field and quasi-TEM time domain analyses of various coupled microstrip line configurations are presented and compared. The full field analysis as well as the quasi-TEM analysis are performed using (different) finite difference time domain algorithms. The first solves Maxwell´s equations and the latter solves the multiconductor transmission line (MTL) equations. The capacitance and inductance matrices required for the MTL solution are determined using a previously published electrostatic Green´s function technique. The coupled microstrip lines are terminated with resistive loads with values close to the characteristic impedances of the lines. Time domain results show that the quasi-TEM analysis is very qualitatively similar but not the same as the full field analysis. The quasi-TEM analysis requires much less computer resources and may be sufficient for some cases. For more complicated structures only a full field analysis can show some detailed coupling phenomena.
Keywords :
Green´s function methods; Maxwell equations; finite difference time-domain analysis; microstrip lines; transmission line matrix methods; Maxwell´s equations; capacitance; coupled microstrip circuits; coupled microstrip lines; coupling phenomena; electrostatic Green´s function technique; finite difference time domain algorithms; full field analysis; inductance matrices; multiconductor transmission line equations; quasi-TEM time domain numerical analysis; resistive loads; Algorithm design and analysis; Capacitance; Couplings; Finite difference methods; Maxwell equations; Microstrip; Multiconductor transmission lines; Numerical analysis; Performance analysis; Time domain analysis;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1995. AP-S. Digest
Conference_Location :
Newport Beach, CA, USA
Print_ISBN :
0-7803-2719-5
DOI :
10.1109/APS.1995.530864