• DocumentCode
    2245527
  • Title

    Artifact assessment of RARE sequence in brain with motion reduction techniques

  • Author

    Hedjazi, M. ; Rahbar, N. ; Sharafi, A.A. ; Khodadoost, A.A.

  • Author_Institution
    Dept. of Med. Phys., Tehran Univ., Iran
  • fYear
    1995
  • fDate
    15-18 Feb 1995
  • Abstract
    Rapid acquisition relaxation-enhanced (RARE) sequences provide images with highly T2-weighted contrast in substantially reduced imaging times. The authors compared artifacts conspicuity on RARE and spin echo T2-weighted imaging of the brain in 24 patients from 12 to 65 years in age on a 0.28-T MR unit. The ghost and motion artifacts were quantitively evaluated. Three reviewers then independently analyzed the images for (a) susceptibility effect, (b) truncation artifact. In this study motion artifacts were reduced with the RARE compared with SE sequence (p<0.05). Furthermore, RARE with gradient-reorientation techniques appears to be a powerful solution to all types of motion artifacts in the brain. RARE images were rated the same as SE images in 100% (69 of 69) of the case reviews for truncation artifact and 56% (38 of 69) for susceptibility effect
  • Keywords
    biomedical NMR; brain; magnetic susceptibility; medical image processing; motion estimation; spin-spin relaxation; 0.28 T; 12 to 65 y; RARE sequence; T2-weighted contrast; artifact assessment; brain MRI; ghost artifacts; imaging time reduction; magnetic resonance imaging; medical diagnostic imaging; motion artifacts; motion reduction techniques; susceptibility effect; truncation artifact; Biomedical imaging; Hospitals; Image analysis; Performance evaluation; Phase noise; Physics; Radiology; Signal to noise ratio; Silicon compounds; Tellurium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1995 and 14th Conference of the Biomedical Engineering Society of India. An International Meeting, Proceedings of the First Regional Conference., IEEE
  • Conference_Location
    New Delhi
  • Print_ISBN
    0-7803-2711-X
  • Type

    conf

  • DOI
    10.1109/RCEMBS.1995.511707
  • Filename
    511707