Title :
Haptic Sensing and Modeling of Nanomanipulation with an AFM
Author :
Fok, L.M. ; Liu, Y.H. ; Li, Wen J.
Author_Institution :
Lab. of Robot Control, Hong Kong Chinese Univ.
Abstract :
This paper describes a virtual reality and haptic interface between human and the atomic force microscope (AFM), which allows the operator to sense and touch the surface and nanoparticles during the manipulation with an AFM tip. The tip-sample interaction forces and intermolecular forces between the tip and surface are modeled based on Lennard-Jones potential and JKR theory, respectively. Our objective is to provide a 3D virtual reality interface capable of displaying topography of surface for the users and allow them to predict the results for the manipulation
Keywords :
Lennard-Jones potential; atomic force microscopy; haptic interfaces; intermolecular forces; nanotechnology; physics computing; virtual reality; 3D virtual reality interface; JKR theory; Lennard-Jones potential; atomic force microscope; haptic sensing; intermolecular force modeling; nanomanipulation modeling; tip-sample interaction force modeling; Atomic force microscopy; Haptic interfaces; Lithography; Polymer films; Probes; Rough surfaces; Surface roughness; Surface topography; Virtual reality; Voltage; Atomic Force Microscope; Haptic Interface; Nanomanipulation; Virtual Reality;
Conference_Titel :
Robotics and Biomimetics, 2004. ROBIO 2004. IEEE International Conference on
Conference_Location :
Shenyang
Print_ISBN :
0-7803-8614-8
DOI :
10.1109/ROBIO.2004.1521821
