• DocumentCode
    2245701
  • Title

    Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory

  • Author

    Allen, Gregory R. ; Guertin, Steven M. ; Scheick, Leif Z. ; Irom, Farokh ; Zajac, Stephanie

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    This paper reports heavy ion, proton, and laser induced single event effects results for a variety of microelectronic devices targeted for possible use in NASA spacecrafts. The compendium covers devices tested within the years of 2010 through 2012.
  • Keywords
    integrated circuit testing; radiation hardening (electronics); NASA spacecrafts; heavy ion; jet propulsion laboratory; laser induced single event effects; microelectronic devices; proton; single event effect testing; Ions; Laboratories; Lasers; Performance evaluation; Propulsion; Radiation effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2012 IEEE
  • Conference_Location
    Tucson, AZ
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4673-2730-5
  • Type

    conf

  • DOI
    10.1109/REDW.2012.6353747
  • Filename
    6353747
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2245701