Title :
Measurement of a flat lens focusing in a 2D photonic crystal at optical wavelength
Author :
Fabre, N. ; Lalouat, L. ; Cluzel, B. ; Melique, X. ; Lippens, D. ; de Fornel, F. ; Vanbesien, O.
Author_Institution :
IEMN Inst. d´´Electron. de Microelectron. et de Nanotechnol., Villeneuve d´´Ascq
Abstract :
Using scanning near field optical microscopy (SNOM), we observed the focusing effect provided by negative refraction in a 2D photonic crystal. Experimental observations are analyzed in light of FDTD 3D simulations.
Keywords :
finite difference time-domain analysis; lenses; optical focusing; optical materials; optical microscopy; photonic crystals; refractive index; 2D photonic crystal; FDTD 3D simulation; SNOM; flat lens focusing effect; negative refraction; optical wavelength; scanning near field optical microscopy; Electromagnetic measurements; Electromagnetic propagation; Electromagnetic waveguides; Lenses; Optical microscopy; Optical propagation; Optical refraction; Optical waveguides; Photonic crystals; Wavelength measurement; (0230.5298) Photonic crystals; (180.4243) Near field microscopy;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
