• DocumentCode
    2246446
  • Title

    Test methods and test equipment for surges and transients

  • Author

    Young, S.N.

  • fYear
    1998
  • fDate
    35844
  • Firstpage
    42552
  • Lastpage
    42558
  • Abstract
    This paper looks at the surges and transients that are causing increasing problems for the designers and users of modern electrical and electronic devices. In order to investigate the effects of transients, and more importantly to verify that protective measures designed into the devices are adequate, simulation of real world transients is required. The paper investigates the test equipment required and the test methods and set-ups used for testing
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Surges, Transients and EMC (Ref. No. 1998/184), IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/ic:19980007
  • Filename
    666472