• DocumentCode
    2246770
  • Title

    Design of AND and NAND Logic Gate Using NDR-BASED Circuit Suitable for CMOS Process

  • Author

    Liang, Dong-Shong ; Tai, Cheng-Chi ; Gan, Kwang-Jow ; Tsai, Cher-Shiung ; Chen, Yaw-Hwang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
  • fYear
    2006
  • fDate
    4-7 Dec. 2006
  • Firstpage
    1325
  • Lastpage
    1328
  • Abstract
    AND and NAND logic gate based on the negative differential resistance (NDR) device is demonstrated. This NDR device is made of metal-oxide-semiconductor field-effect-transistor (MOS) devices that could exhibit the NDR characteristic in the current-voltage curve by suitably arranging the MOS parameters. The devices and circuits are implemented by the standard 0.35mum CMOS process
  • Keywords
    CMOS logic circuits; logic design; logic gates; 0.35 micron; AND logic gate; CMOS process; MOS parameters; NAND logic gate; NDR-based circuit; logic design; metal-oxide-semiconductor field-effect-transistor; negative differential resistance device; CMOS logic circuits; CMOS process; Circuit simulation; Logic circuits; Logic design; Logic devices; Logic gates; MOS devices; Switches; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    1-4244-0387-1
  • Type

    conf

  • DOI
    10.1109/APCCAS.2006.342428
  • Filename
    4145645