• DocumentCode
    2247156
  • Title

    Design of Dynamically Assignmentable TAM Width for Testing Core-Based SOCs

  • Author

    Rau, Jiann-Chyi ; Chen, Chien-Shiun ; Wu, Po-Han

  • Author_Institution
    Dept. of Electr. Eng., Tamkang Univ., Taipei
  • fYear
    2006
  • fDate
    4-7 Dec. 2006
  • Firstpage
    1399
  • Lastpage
    1402
  • Abstract
    Test access mechanism (TAM) and testing schedule for system-on-chip (SOC) are challenging problems. Testing schedule must be effective to minimize testing time, under the constraint of test resources. This paper presents a new method based on generalized rectangle packing, as two-dimensional packing. A core cuts into many pieces and utilizes the design of reconfigurable core wrappers, and is dynamic to change the width of the TAM executing the core test. Therefore, a core can utilize different TAM width to complete test
  • Keywords
    design for testability; integrated circuit testing; scheduling; system-on-chip; core-based SOC testing; generalized rectangle packing; reconfigurable core wrapper; system-on-chip; test access mechanism; testing schedule; two-dimensional packing; Design engineering; Design for testability; Dynamic scheduling; Hardware; Multiplexing; Pins; Registers; System testing; System-on-a-chip; Time factors; SOC Testing; TAM; Testing Scheduling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    1-4244-0387-1
  • Type

    conf

  • DOI
    10.1109/APCCAS.2006.342462
  • Filename
    4145662