• DocumentCode
    2247254
  • Title

    Integrity analysis of solder joints; fracture mechanics approach

  • Author

    Kim, Dong-Hak ; Kang, Ki-Ju ; Earmme, Youn-Young

  • Author_Institution
    Dept. of Mech. Eng., Chonnam Nat. Univ., South Korea
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    404
  • Lastpage
    411
  • Abstract
    Brass/solder/brass sandwich CTS (compact tension-shear) specimens were fracture tested under various loading angles. The fracture toughness vs. mode mixity relation is asymmetric and the crack often jumps from the one interface to the other as the fracture proceeds. Because the toughness is exceptionally high ( Jc=300~900J/m 2) in comparison with ordinary metal or non-metal bond, the plastic deformation of the ductile layer is so constrained due to the stiff elastic substrates. It appears to play an important role in the fracture behavior. In order to address these issues a step-by-step approach has been taken. First, analytic models, so called ´modified Dugdale´ and ´modified Irwin model´ were made to estimate the plastic zone size near the crack tip with respect to the mode mixity as well as the external load. Second, the near-tip stress field under mode-I loading, for which both models gave erroneous estimation, was analyzed by a slip line field model. Third, with aids of incremental theory of plasticity implemented in finite element code, the crack growth behavior was estimated for two kinds of fracture mechanisms
  • Keywords
    crack-edge stress field analysis; finite element analysis; fracture mechanics; fracture toughness; plastic deformation; soldering; CTS; brass/solder/brass sandwich; compact tension-shear specimens; crack growth behavior; crack tip; external load; finite element code; fracture mechanics; fracture toughness; integrity analysis; loading angles; mode mixity; mode-I loading; modified Dugdale model; modified Irwin model; near-tip stress field; plastic deformation; plastic zone size; slip line field model; solder joints; stiff elastic substrates; Electronic packaging thermal management; Electronics packaging; Fatigue; Finite element methods; Mechanical engineering; Plastics; Soldering; Stress; Testing; Thermal loading;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2001. EMAP 2001. Advances in
  • Conference_Location
    Jeju Island
  • Print_ISBN
    0-7803-7157-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2001.984018
  • Filename
    984018