• DocumentCode
    2247390
  • Title

    Shear strength and aging characteristics of Sn-Pb and Sn-Ag-Bi solder bumps

  • Author

    Choi, Jin-Won ; Oh, Tae-Sung

  • Author_Institution
    Dept. of Metall. Eng. & Mater. Sci., Hong Ik Univ., Seoul, South Korea
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    433
  • Lastpage
    437
  • Abstract
    Ball shear strength and aging characteristics of the 63Sn-37Pb solder bumps were characterized with variations of UBM finish (Au/Ni/Cu and Ni/Cu) and solder ball size (0.35 to 0.76 mm). Also, tensile strength, ball shear strength, and aging characteristics of the Sn-3.5Ag-Bi solder alloys were investigated. When formed on Au/Ni/Cu UBM, ball shear strength of the 63Sn-37Pb solder bumps of 0.35 mm size was higher than those of the 0.62 and 0.76 mm sizes due to precipitation hardening of Au-Sn intermetallic compounds. When the bump size was identical, the 63Sn-37Pb solder bumps exhibited higher shear strength on Au/Ni/Cu UBM than on Ni/Cu UBM. Shear strength of the 63Sn-37Pb solder bumps formed on Ni/Cu UBM varied little with aging at 150°C up to 1000 hours. With increasing aging time, the failure mode of the 63Sn-37Pb solder bumps on Au/Ni/Cu UBM was changed from ductile fracture (solder failure) to brittle fracture (interface failure). The 63Sn-37Pb solder bumps on Ni/Cu UBM showed ductile fracture regardless of the aging time up to 1000 hours. Tensile strength of the Sn3.5Ag-Bi alloys increased with increasing Bi content up to 9 wt.%. Ball shear strength of the Sn-3.5Ag-Bi solder bumps increased with increasing Bi content and reached a maximum at 5-7 wt.% Bi. Shear strength of the Sn-3.5Ag-5Bi solder bumps increased substantially from 70 MPa to 84 MPa by aging at 150°C for 300 hours
  • Keywords
    ageing; assembling; bismuth alloys; brittle fracture; ductile fracture; failure analysis; lead alloys; packaging; precipitation hardening; reflow soldering; shear strength; silver alloys; surface treatment; tensile strength; tin alloys; 0.35 to 0.76 mm; 1000 hr; 150 C; 300 hr; Au-Sn intermetallic compounds; Au/Ni/Cu UBM finish; Bi content; Ni/Cu UBM finish; Sn-Ag-Bi; Sn-Ag-Bi solder bumps; Sn-Pb; Sn-Pb solder bumps; UBM finish; aging; aging characteristics; ball shear strength; brittle fracture; bump size; ductile fracture; failure mode; interface failure; precipitation hardening; shear strength; solder ball size; solder bumps; solder failure; tensile strength; Aging; Bismuth; Copper alloys; Electronics packaging; Gold alloys; Intermetallic; Materials science and technology; Nickel alloys; Soldering; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2001. EMAP 2001. Advances in
  • Conference_Location
    Jeju Island
  • Print_ISBN
    0-7803-7157-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2001.984023
  • Filename
    984023