The topology and test technology of Digitally Controlled Potentiometers

Author

Li, Wei ; Sha, Zhan-you ; Wang, Bin

Author_Institution

Coll. of Electr. Eng. & Inf. Sci., Hebei Univ. of Sci. & Technol., Shijiazhuang, China

Volume

5

fYear

2010

fDate

11-14 July 2010

Firstpage

2345

Lastpage

2349

Abstract

The Digitally Controlled Potentiometers (DCP) is a new type of electronic device with great developing foreground, which can replace the traditional mechanical potentiometer in many fields. The programmable gain amplifier, programmable filter and others programmable analogy devices can be built using SCM and DCP through programming. Thereby it is realizable to “Set the analogy device onto the bus” (controlling analogy modules through bus by MCU). The methods presented all have practical significance.

Keywords

CMOS integrated circuits; digital control; integrated circuit testing; mixed analogue-digital integrated circuits; potentiometers; CMOS; analogy modules; digitally controlled potentiometers; electronic device; programmable analogy devices; programmable filter; programmable gain amplifier; test technology; topology; Bandwidth; Capacitance; Potentiometers; Resistance; Resistors; Testing; Voltage measurement; BW; Digitally controlled potentiometers; Mathematical model; Nonlinear error; Testing circuit;

fLanguage

English

Publisher

ieee

Conference_Titel

Machine Learning and Cybernetics (ICMLC), 2010 International Conference on

Conference_Location

Qingdao

Print_ISBN

978-1-4244-6526-2

Type

conf

DOI

10.1109/ICMLC.2010.5580663

Filename

5580663