DocumentCode :
2247391
Title :
The topology and test technology of Digitally Controlled Potentiometers
Author :
Li, Wei ; Sha, Zhan-you ; Wang, Bin
Author_Institution :
Coll. of Electr. Eng. & Inf. Sci., Hebei Univ. of Sci. & Technol., Shijiazhuang, China
Volume :
5
fYear :
2010
fDate :
11-14 July 2010
Firstpage :
2345
Lastpage :
2349
Abstract :
The Digitally Controlled Potentiometers (DCP) is a new type of electronic device with great developing foreground, which can replace the traditional mechanical potentiometer in many fields. The programmable gain amplifier, programmable filter and others programmable analogy devices can be built using SCM and DCP through programming. Thereby it is realizable to “Set the analogy device onto the bus” (controlling analogy modules through bus by MCU). The methods presented all have practical significance.
Keywords :
CMOS integrated circuits; digital control; integrated circuit testing; mixed analogue-digital integrated circuits; potentiometers; CMOS; analogy modules; digitally controlled potentiometers; electronic device; programmable analogy devices; programmable filter; programmable gain amplifier; test technology; topology; Bandwidth; Capacitance; Potentiometers; Resistance; Resistors; Testing; Voltage measurement; BW; Digitally controlled potentiometers; Mathematical model; Nonlinear error; Testing circuit;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Machine Learning and Cybernetics (ICMLC), 2010 International Conference on
Conference_Location :
Qingdao
Print_ISBN :
978-1-4244-6526-2
Type :
conf
DOI :
10.1109/ICMLC.2010.5580663
Filename :
5580663
Link To Document :
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