• DocumentCode
    2248049
  • Title

    Ultra Low Power Weak Inversion Current Steered Digital to Analog Converter

  • Author

    Fitrio, David ; Stojcevski, Aleksandar ; Singh, Jugdutt

  • Author_Institution
    Centre of Telecommun. & Microelectron., Victoria Univ., Melbourne, Vic.
  • fYear
    2006
  • fDate
    4-7 Dec. 2006
  • Firstpage
    1543
  • Lastpage
    1546
  • Abstract
    Due to high functionality integration in electronic devices and the ever increasing requirements for low power devices, there is an urgent need for novel low power approaches. The advancement in technology scaling has made it feasible to incorporate the extra functionality, however by increasing devices sensitivity to variations, the overall device yield decreases. Process and temperature variations are the biggest contributing factors in delay and leakage current, especially in mixed-signal circuitry. This paper considers the possibility of reducing the effect of variations to improve linearity on transistor-only DACs (MOSFET DAC) operating in weak inversion. The main drawback in biasing a transistor in the weak inversion region is the poor transistor mismatch which will affect the overall linearity. However, the mismatch can be reduced by introducing a compensation circuits. The circuits are designed with 0.13 mum ST-Microelectronic low leakage CMOS technology
  • Keywords
    CMOS integrated circuits; compensation; digital-analogue conversion; integrated circuit reliability; 0.13 micron; MOSFET DAC; ST-Microelectronic CMOS technology; current steered digital-to-analog converter; linearity improvement; technology scaling; transistor-only DAC; variation effect reduction; weak inversion digital-to-analog converter; CMOS technology; Circuits; Digital-analog conversion; Leakage current; Linearity; MOSFETs; Operational amplifiers; Resistors; Temperature sensors; Voltage; Digital-to-Analog Converters; MOSFETs; weak inversion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    1-4244-0387-1
  • Type

    conf

  • DOI
    10.1109/APCCAS.2006.342537
  • Filename
    4145699