Title :
Progress and preliminary results on EB stepper
Author :
Kawata, S. ; Hamashima, M. ; Miura, T. ; Suzuki, K. ; Okamoto, K. ; Yamaguchi, T.
Author_Institution :
Precision Equip. Co., Nikon Corp., Saitama, Japan
fDate :
Oct. 31 2001-Nov. 2 2001
Abstract :
As Next Generation Lithography (NGL) systems, several systems are proposed. EPL (Electron Beam Projection Lithography) system, which is one of NGL systems using electron beam (EB), is expected to be a most promising candidate, which has a high throughput (>20 wph of a 300 mm wafer) and a high resolution (<70 nm). Many studies on NGL systems have been reported but most of them were limited to basic scientific discussions on the research level. There are few discussions on technical issues on each system. Nikon has developed EPL system (EB Stepper) in collaboration with IBM. The development moves to the system evaluation phase. Discussions on EB Stepper must be technical rather than scientific. In this paper recent progress on EB Stepper will be discussed.
Keywords :
electron beam lithography; EB Stepper; electron beam projection lithography; next generation lithography; Biomembranes; Electron beams; Electron optics; Electrooptic deflectors; High speed optical techniques; Lithography; Optical scattering; Page description languages; Research and development; System testing;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2001 International
Conference_Location :
Shimane, Japan
Print_ISBN :
4-89114-017-8
DOI :
10.1109/IMNC.2001.984058