DocumentCode
2248356
Title
SPM application of carbon nanotubes: probes and tweezers
Author
Nakayama, Y. ; Akita, S.
Author_Institution
Dept. of Phys. & Electron., Osaka Prefecture Univ., Japan
fYear
2001
fDate
Oct. 31 2001-Nov. 2 2001
Firstpage
60
Lastpage
61
Abstract
In this paper, we report the processes of the growth and manipulation of carbon nanotubes, which enables us to fabricate not only nanotube probes but also nanotube tweezers. We also discuss scanning probe microscope (SPM) images taken by resulted nanotube probes and operation of nanotube tweezers.
Keywords
carbon nanotubes; scanning probe microscopy; C; carbon nanotube; probe; scanning probe microscope; tweezers; Arm; Atomic measurements; Carbon nanotubes; Electrostatics; Mechanical factors; Nanobioscience; Nanomaterials; Scanning probe microscopy; Shape; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2001 International
Conference_Location
Shimane, Japan
Print_ISBN
4-89114-017-8
Type
conf
DOI
10.1109/IMNC.2001.984068
Filename
984068
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