Title :
SPM application of carbon nanotubes: probes and tweezers
Author :
Nakayama, Y. ; Akita, S.
Author_Institution :
Dept. of Phys. & Electron., Osaka Prefecture Univ., Japan
fDate :
Oct. 31 2001-Nov. 2 2001
Abstract :
In this paper, we report the processes of the growth and manipulation of carbon nanotubes, which enables us to fabricate not only nanotube probes but also nanotube tweezers. We also discuss scanning probe microscope (SPM) images taken by resulted nanotube probes and operation of nanotube tweezers.
Keywords :
carbon nanotubes; scanning probe microscopy; C; carbon nanotube; probe; scanning probe microscope; tweezers; Arm; Atomic measurements; Carbon nanotubes; Electrostatics; Mechanical factors; Nanobioscience; Nanomaterials; Scanning probe microscopy; Shape; Voltage;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2001 International
Conference_Location :
Shimane, Japan
Print_ISBN :
4-89114-017-8
DOI :
10.1109/IMNC.2001.984068
