Title :
A Method for the Correction of N-Ports Scattering Parameters Measurement
Author :
Zhao, Baishan ; Zhu, Yi-Sheng
Author_Institution :
Coll. of Inf. Eng., Dalian Maritime Univ.
Abstract :
In this paper, a method used to reduce the errors in the scattering parameters measurement of N-ports based on two-port vector network analyzer (VNA) is presented, which is based on the normalization and renormalization of the scattering matrix, formulated equations are introduced to correct the reflective parameters of terminations according to the transformed scattering matrices, and an optimization procedure is given to precise the values of reflective parameters, the errors of the scattering parameters can be reduced for the corrected reflective parameters. The corrected method is proved by measured results
Keywords :
S-parameters; network analysers; two-port networks; N-ports scattering parameters measurement; reflective parameters; scattering matrix normalization; scattering matrix renormalization; transformed scattering matrices; two-port vector network analyzer; Educational institutions; Electronic mail; Equations; Error correction; Impedance; Information analysis; Optimization methods; Performance analysis; Performance evaluation; Scattering parameters; normalization; reflective parameter; scattering parameter;
Conference_Titel :
Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on
Conference_Location :
Singapore
Print_ISBN :
1-4244-0387-1
DOI :
10.1109/APCCAS.2006.342079