• DocumentCode
    2248672
  • Title

    Conductivity of thin metal films at THz frequencies

  • Author

    Laman, N. ; Grischkowsky, D.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Oklahoma State Univ., Stillwater, OK
  • fYear
    2008
  • fDate
    4-9 May 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The conductivity of thin metal films was measured via their transmission at THz frequencies. The conductivity of all the films, particularly the thinner films and Al films, were much smaller than the bulk DC value.
  • Keywords
    aluminium; electrical conductivity; metallic thin films; submillimetre wave spectra; Al; THz frequencies; THz transmission; conductivity; thin metal films; Conductive films; Conductivity; Frequency dependence; Gold; Infrared spectra; Optical films; Scattering; Semiconductor films; Semiconductor thin films; Thickness measurement; (160.3900) Metals; (300.6270) Spectroscopy, far infrared;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-55752-859-9
  • Type

    conf

  • Filename
    4571983
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2248672