Title :
Analysis of radiation caused by LSI package cross talk and cable by using the time-domain moment method
Author :
Ohtsu, Shinichi ; Nagase, Kenji ; Yamagajou, Takeshi
Author_Institution :
Corporate Component Eng. Center, Fujitsu Ltd., Kawasaki, Japan
Abstract :
We have developed the direct time-domain moment method, which is applicable to arbitrarily shaped models made of conductors and dielectrics. Using the method, we have analyzed the cross talk phenomenon within a LSI package. We have shown that, in the PCB with the LSI and a cable, the noise induced by the cross talk causes the strong radiation through the cable. Still more we have shown a remedy for the cross talk by simulations.
Keywords :
cables (electric); crosstalk; electromagnetic interference; large scale integration; method of moments; printed circuits; time-domain analysis; LSI package cross talk; arbitrarily shaped models; cable; conductors; dielectrics; induced noise; radiation analysis; time-domain moment method; Aircraft; Communication cables; Current; Dielectrics; Frequency domain analysis; Large scale integration; Moment methods; Packaging; Time domain analysis; Transient analysis;
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
DOI :
10.1109/ISEMC.2002.1032487
