• DocumentCode
    2249093
  • Title

    Noise coupling to on-chip integrated antennas

  • Author

    Dickson, Timothy O. ; Bravo, Daniel F. ; Mehta, Jesal ; O, Kenneth K.

  • Author_Institution
    Florida Univ., Gainesville, FL, USA
  • Volume
    1
  • fYear
    2002
  • fDate
    19-23 Aug. 2002
  • Firstpage
    340
  • Abstract
    Noise from digital circuits can couple to on-chip integrated antennas and degrade the received signal-to-noise ratio. To investigate coupling mechanisms, integrated antennas and noise generating circuits were fabricated in 0.25 μm and 0.1 μm CMOS processes. Noise coupling through the substrate is found to be common-mode in nature. Signals on long interconnects near antennas, as well as time-varying signals on VDD and ground lines from switching action, are found to capacitively couple to antennas. Loss and phase delay in the transmission line cause this coupling to appear differentially. Less noise is found to couple in balanced measurements. This suggests that by using integrated antennas with a balanced feed structure, noise coupling can be reduced.
  • Keywords
    CMOS digital integrated circuits; antennas; digital circuits; electric noise measurement; electromagnetic coupling; electromagnetic interference; interconnections; switching; 0.1 micron; 0.25 micron; CMOS processes; balanced feed structure; common-mode noise; digital circuits; ground lines; integrated antennas; long interconnects; loss; noise coupling; noise generating circuits; on-chip integrated antennas; phase delay; received signal-to-noise ratio degradation; switching action; time-varying signals; transmission line; CMOS process; Coupling circuits; Degradation; Delay; Digital circuits; Integrated circuit interconnections; Noise generators; Propagation losses; Receiving antennas; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
  • Conference_Location
    Minneapolis, MN, USA
  • Print_ISBN
    0-7803-7264-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.2002.1032500
  • Filename
    1032500