• DocumentCode
    2249415
  • Title

    Correlation of EMI measurements and simulations for simple package geometries

  • Author

    Ji, Yun ; Slattery, Kevin P. ; Skinner, Harry G.

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • Volume
    1
  • fYear
    2002
  • fDate
    19-23 Aug. 2002
  • Firstpage
    419
  • Abstract
    This paper presents three measurement- and one simulation-approaches to quantify radiation from IC-package geometries. Two test boards were built and measured by using a semi-anechoic chamber, GTEM cell and near-field scan. Good correlations were achieved between measurements and simulations. Advantages and limits of each approach were addressed.
  • Keywords
    TEM cells; anechoic chambers (electromagnetic); electric noise measurement; electromagnetic interference; EMI measurements; EMI simulations; GTEM cell; TEM cell; radiation quantification; semi-anechoic chamber; simple package geometries; test boards; Antenna measurements; Electromagnetic interference; Frequency; Geometry; Magnetic field measurement; Packaging; Probes; Solid modeling; TEM cells; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
  • Conference_Location
    Minneapolis, MN, USA
  • Print_ISBN
    0-7803-7264-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.2002.1032515
  • Filename
    1032515
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2249415