DocumentCode
2249728
Title
Thermal Driven Module Placement Using Sequence-pair
Author
Okada, Norihide ; Kodama, Chikaaki ; Sato, Takashi ; Fujiyoshi, Kunihiro
Author_Institution
Dept. of Electr. & Electron. Eng., Tokyo Univ. of Agric. & Technol.
fYear
2006
fDate
4-7 Dec. 2006
Firstpage
1871
Lastpage
1874
Abstract
TThe increase of power consumption in recent VLSI chip has led to uneven thermal distribution and high temperature on the chip. This brings inappropriate distribution of wire delay and may adversely effect the behavior of the chip by the increase of clock skew. The rise of local temperature causes the electro migration which brings wire disconnections. Therefore, some module placement methods considering the thermal distribution were proposed so far. However, these conventional methods require much time for obtaining the placement. In this paper, we propose a method to quickly obtain a module placement with good thermal distribution. We confirmed that the proposed method with simulated annealing can obtain good placements in shorter time
Keywords
VLSI; modules; simulated annealing; system-on-chip; VLSI chip; module placement; sequence pair; simulated annealing; thermal distribution; thermal driven; Agricultural engineering; Clocks; Delay effects; Energy consumption; Simulated annealing; Temperature distribution; Thermal engineering; Thermal force; Very large scale integration; Wire; module placement; sequence-pair; thermal driven;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on
Conference_Location
Singapore
Print_ISBN
1-4244-0387-1
Type
conf
DOI
10.1109/APCCAS.2006.342204
Filename
4145780
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