DocumentCode :
2250143
Title :
Waferless pattern recognition recipe creation using StatTrax
Author :
Ridens, Martin G. ; Wilson, Eric R. ; Harris, Thomas A.
Author_Institution :
Motorola Inc., Chandler, AZ, USA
fYear :
1996
fDate :
12-14 Nov 1996
Firstpage :
353
Lastpage :
358
Abstract :
Motorola MOS-12 uses Tencor UV-1050 and FT-750 Film Thickness probes for on product measurements at many steps in the fabrication process. Master recipes are manually created for the first mask set of any new process flow. By utilizing a standard scribe grid structure, recipes for subsequent mask sets are created by copying the master recipes then making changes to the coordinates in the die map and pattern recognition sections of each recipe. The ability to create recipes this way reduces engineering time required for new product introduction and significantly reduces cycle time for lead lots. The method provides the best recipe integrity possible and allows the elimination of costly test wafers
Keywords :
MOS integrated circuits; integrated circuit measurement; integrated circuit testing; masks; pattern recognition; probes; production testing; StatTrax; Tencor FT-750; Tencor UV-1050; cycle time; die map; engineering time; fabrication process; film thickness probes; lead lots; mask; new product introduction; on product measurements; pattern recognition sections; recipe creation; standard scribe grid structure; waferless pattern recognition; Area measurement; Etching; Metrology; Monitoring; Pattern recognition; Probes; Process control; Software measurement; Testing; Thickness measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
Conference_Location :
Cambridge, MA
ISSN :
1078-8743
Print_ISBN :
0-7803-3371-3
Type :
conf
DOI :
10.1109/ASMC.1996.558077
Filename :
558077
Link To Document :
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