• DocumentCode
    2250271
  • Title

    Maximum power-up current estimation in combinational CMOS circuits

  • Author

    Sagahyroon, Assim ; Aloul, Fadi

  • Author_Institution
    Dept. of Comput. Eng., Sharjah American Univ.
  • fYear
    2006
  • fDate
    16-19 May 2006
  • Firstpage
    70
  • Lastpage
    73
  • Abstract
    The continuing decrease in feature size and increase in chip density is causing leakage current to be a major contributor to power dissipation in integrated circuits. A viable approach to the reduction of leakage current is to use power cut-off or gating techniques. In power gating, a PMOS sleep transistor is used to turn-on or turn-off the Vdd source to the circuit block. In combinational circuits, the maximum power up current depends only on the input vector that wakes up the circuit from its sleep mode. In this work, we formulate the problem of estimating the maximum power-up current as an integer linear programming (ILP) problem and use advanced Boolean satisfiability (SAT) and generic ILP solvers. Results indicate that generic ILP solvers are very useful in estimating the maximum power-up current
  • Keywords
    CMOS logic circuits; combinational circuits; integer programming; linear programming; Boolean satisfiability; PMOS sleep transistor; combinational CMOS circuits; integer linear programming; integrated circuits; leakage current; maximum power-up current estimation; Automatic test pattern generation; CMOS logic circuits; CMOS technology; Capacitance; Power dissipation; Power supplies; Surges; Switches; Switching circuits; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrotechnical Conference, 2006. MELECON 2006. IEEE Mediterranean
  • Conference_Location
    Malaga
  • Print_ISBN
    1-4244-0087-2
  • Type

    conf

  • DOI
    10.1109/MELCON.2006.1653038
  • Filename
    1653038