• DocumentCode
    2250419
  • Title

    Improvement of imprinted pattern uniformity using sapphire mold

  • Author

    Tokano, Y. ; Taniguchi, J. ; Kawasaki, T. ; Miyamoto, I. ; Komuro, M. ; Hiroshima, H. ; Sakai, N. ; Tada, K.

  • Author_Institution
    Tokyo Univ. of Sci., Chiba, Japan
  • fYear
    2001
  • fDate
    Oct. 31 2001-Nov. 2 2001
  • Firstpage
    188
  • Lastpage
    189
  • Abstract
    Imprint lithography is an attractive technology for LSIs era below 40-nm critical dimension from the viewpoints of high-throughput and low-cost equipment. In order to avoid a pattern placement error due to thermal expansion in the conventional thermal imprint process, we have previously attempted to replicate a mold pattern onto a liquid polymer, which was solidified using ultra-violet (UV) light irradiation at room temperature. The imprint technology based on photo-induced solidification has several advantages such as elimination of heat-up and cool-down time and possibility of step and repeat process. However part of the solidified polymer film was remained on the quartz mold surface. In order to improve this problem, in this article we propose to use a sapphire plate as a mold.
  • Keywords
    lithography; moulding; nanotechnology; sapphire; Al/sub 2/O/sub 3/; nano-imprint lithography; pattern uniformity; sapphire mold; solidification; ultraviolet light irradiation; Degradation; Etching; Lithography; Polymer films; Resists; Silicon; Substrates; Temperature; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2001 International
  • Conference_Location
    Shimane, Japan
  • Print_ISBN
    4-89114-017-8
  • Type

    conf

  • DOI
    10.1109/IMNC.2001.984153
  • Filename
    984153