DocumentCode
2250419
Title
Improvement of imprinted pattern uniformity using sapphire mold
Author
Tokano, Y. ; Taniguchi, J. ; Kawasaki, T. ; Miyamoto, I. ; Komuro, M. ; Hiroshima, H. ; Sakai, N. ; Tada, K.
Author_Institution
Tokyo Univ. of Sci., Chiba, Japan
fYear
2001
fDate
Oct. 31 2001-Nov. 2 2001
Firstpage
188
Lastpage
189
Abstract
Imprint lithography is an attractive technology for LSIs era below 40-nm critical dimension from the viewpoints of high-throughput and low-cost equipment. In order to avoid a pattern placement error due to thermal expansion in the conventional thermal imprint process, we have previously attempted to replicate a mold pattern onto a liquid polymer, which was solidified using ultra-violet (UV) light irradiation at room temperature. The imprint technology based on photo-induced solidification has several advantages such as elimination of heat-up and cool-down time and possibility of step and repeat process. However part of the solidified polymer film was remained on the quartz mold surface. In order to improve this problem, in this article we propose to use a sapphire plate as a mold.
Keywords
lithography; moulding; nanotechnology; sapphire; Al/sub 2/O/sub 3/; nano-imprint lithography; pattern uniformity; sapphire mold; solidification; ultraviolet light irradiation; Degradation; Etching; Lithography; Polymer films; Resists; Silicon; Substrates; Temperature; Thermal expansion;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2001 International
Conference_Location
Shimane, Japan
Print_ISBN
4-89114-017-8
Type
conf
DOI
10.1109/IMNC.2001.984153
Filename
984153
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