Title :
Robotic workstation for AFM-based nanomanipulation inside an SEM
Author :
Mick, U. ; Weigel-Jech, M. ; Fatikow, S.
Author_Institution :
Div. Microrobotics & Control Eng. (AMiR), Univ. of Oldenburg & the Technol. Cluster Automated Nanohandling (TCANH), Oldenburg, Germany
Abstract :
Combining the SEM as a visual sensor with the force control of an AFM promises to provide a unique tool for automated robotic nanomanipulations. This article presents the development of a nanorobotic workstation that can use AFM capabilities for robotic nanomanipulations inside an SEM. The hardware architecture for the AFM setup inside the SEM is described in detail. The AFM capabilities are demonstrated by in-situ acquired AFM and SEM images of identical sample locations. Initial AFM-based manipulation experiments on manipulating a graphene sheet and on pushing nanosized polymer beads are presented. The integration of the system with haptic feedback for teleoperation and into a robotic automation and visual control framework is discussed.
Keywords :
atomic force microscopy; force control; micromanipulators; nanomechanics; AFM capabilities; AFM setup; AFM-based manipulation; AFM-based nanomanipulation; SEM images; automated robotic nanomanipulations; force control; graphene sheet; haptic feedback; hardware architecture; identical sample locations; in-situ acquired AFM; nanorobotic workstation; pushing nanosized polymer beads; robotic automation; teleoperation; visual control framework; visual sensor;
Conference_Titel :
Advanced Intelligent Mechatronics (AIM), 2010 IEEE/ASME International Conference on
Conference_Location :
Montreal, ON
Print_ISBN :
978-1-4244-8031-9
DOI :
10.1109/AIM.2010.5695899