• DocumentCode
    2250756
  • Title

    Lane level positioning using particle filtering

  • Author

    Selloum, A. ; Bétaille, D. ; Le Carpentier, E. ; Peyret, F.

  • Author_Institution
    Lab. Central de Ponts et Chaussees, Inst. de Rech. en Commun. et Cybernetique de Nantes, Nantes, France
  • fYear
    2009
  • fDate
    4-7 Oct. 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    GPS positioning and map-matching are key technologies used in Car Navigation Systems. Next generation of Cooperative Vehicle Infrastructure Systems (CVIS) will surely require positioning component with higher accuracy, integrity and availability, for instance for the needs of lane-level applications. The concept of Map Aided Location (MAL) was introduced recently: it consists in considering the map contents (geometry and topology) as constraints in the positioning problem. The main contribution of the work reported in this article concerns the evolution model of the vehicle: whereas previous research investigations were based on usual models in plane coordinates, we propose here an evolution model adapted to the local curvature of the road. Therefore, road constraints are emphasized, particularly when GPS outages occur. An enhanced map (Emap) - where all lanes are represented with decimeter accuracy - is used in this Map Aided Location process.
  • Keywords
    Global Positioning System; automated highways; cartography; particle filtering (numerical methods); road vehicles; GPS positioning; car navigation systems; cooperative vehicle infrastructure systems; enhanced map; geometry constraint; lane level positioning; map aided location; map-matching; particle filter; road curvature; topology constraint; Filtering; Geometry; Global Positioning System; Intelligent transportation systems; Navigation; Road transportation; Road vehicles; Robot kinematics; Robot vision systems; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Transportation Systems, 2009. ITSC '09. 12th International IEEE Conference on
  • Conference_Location
    St. Louis, MO
  • Print_ISBN
    978-1-4244-5519-5
  • Electronic_ISBN
    978-1-4244-5520-1
  • Type

    conf

  • DOI
    10.1109/ITSC.2009.5309850
  • Filename
    5309850