• DocumentCode
    2250946
  • Title

    Study on auto-path planning according to grade priority for sorting dies

  • Author

    Wu, Tao ; Li, Bin ; Wang, Long-wen ; Huang, Yu

  • Author_Institution
    Nat. Numerical Control Syst. Eng. Res. Center, Huazhong Univ. of Sci. & Technol., Wuhan, China
  • Volume
    3
  • fYear
    2010
  • fDate
    11-14 July 2010
  • Firstpage
    1590
  • Lastpage
    1595
  • Abstract
    Semiconductor light-emitting diode (LED) has now become one of the most popular lighting devices. Before diodes are put into process of package, they need be inspected and graded strictly, so following waste will be saved. Cost of inspection and sort is relatively high, it is urgently needed to improve sort efficiency and reduce sort time. This is a problem needs comprehensive consideration. Sort performance is influenced by acts such as feeding, ejecting, transporting, placing, recycle bin positioning, and so on. Stochastic Petri net model of concurrent control of multi-shafts scheduling is built to analyze the performance and its influenced factors. It can be revealed that positioning of recycle bins is the major influence factor. Because of this, a path planning method according grade, the diodes with same grade should get priority to be sorted first, is put forward. Techniques about die search and merge by grade, traversal of forward and backtrack with cross priority are described in detail. With reasonable simulations, this optimization is obviously proved effective to reduce sort time and improve diodes production rate.
  • Keywords
    Petri nets; control engineering computing; dies (machine tools); inspection; light emitting diodes; lighting; path planning; performance evaluation; scheduling; shafts; sorting; LED; auto-path planning; concurrent control; dies; grade priority; inspection; lighting devices; multishafts scheduling; optimization; recycle bins; semiconductor light-emitting diode; sort efficiency; sort performance; sort time; stochastic Petri net model; Lenses; Light emitting diodes; Machine learning; Markov processes; Planning; Production; Recycling; Auto-path planning; Die sorter; Light emitting diodes; Merge by grade; Performance evaluation; Stochastic Petri net;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning and Cybernetics (ICMLC), 2010 International Conference on
  • Conference_Location
    Qingdao
  • Print_ISBN
    978-1-4244-6526-2
  • Type

    conf

  • DOI
    10.1109/ICMLC.2010.5580803
  • Filename
    5580803