DocumentCode :
2251004
Title :
Study on radiation-induced reaction in microscopic region for basic understanding of electron beam patterning in lithographic process (I) - Development of subpicosecond pulse radiolysis and relation between space resolution and radiation-induced reactions
Author :
Kozawa, T. ; Saeki, A. ; Yoshida, Y. ; Tagawa, S.
Author_Institution :
Inst. of Sci. & Ind. Res., Osaka Univ., Japan
fYear :
2001
fDate :
Oct. 31 2001-Nov. 2 2001
Firstpage :
232
Lastpage :
233
Abstract :
To fabricate a structure with nanoscale dimension or even with the line edge roughness of less than several nanometers, it is important to understand the early process of radiation chemistry in resist materials. In this paper, we focussed on the early processes of radiation chemistry in the chemically amplified resists within 100 ps after irradiation in an electron beam lithography system. We constructed the subpicosecond pulse radiolysis with good signal/noise ratio to investigate radiation-induced reactions of an onium salt.
Keywords :
electron resists; nanotechnology; organic compounds; radiolysis; chemically amplified resist; electron beam lithography; line edge roughness; nanofabrication; onium salt; radiation chemistry; radiation-induced reaction; space resolution; subpicosecond pulse radiolysis; Chemicals; Electron beams; Electron microscopy; Ionization; Light sources; Mass production; Microelectronics; Resists; Solvents; X-ray lithography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2001 International
Conference_Location :
Shimane, Japan
Print_ISBN :
4-89114-017-8
Type :
conf
DOI :
10.1109/IMNC.2001.984175
Filename :
984175
Link To Document :
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