DocumentCode :
2251492
Title :
Junction temperature measurement of light-emitting diodes by voltage-temperature relation method
Author :
Yang, Y.K. ; Lien, W.C. ; Huang, Y.C. ; Chen, N.C.
Author_Institution :
Dept. of Electron. Eng., Chang Gung Univ., Tao-Yuan
fYear :
2007
fDate :
26-31 Aug. 2007
Firstpage :
1
Lastpage :
2
Abstract :
The voltage-temperature relation of a light-emitting diode is adopted to determine the junction temperature. This study compares two different methods for junction temperature measurement. Both methods yield results are consistent with the largest difference being only 3.5 K.
Keywords :
light emitting diodes; junction temperature measurement; light-emitting diodes; voltage-temperature relation; Calibration; Current measurement; Displays; Distributed Bragg reflectors; Equations; Light emitting diodes; Pulse measurements; Temperature measurement; Voltage measurement; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1173-3
Electronic_ISBN :
978-1-4244-1174-0
Type :
conf
DOI :
10.1109/CLEOPR.2007.4391713
Filename :
4391713
Link To Document :
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