Title :
A time-domain diagnostic method for emission measurements in TEM cells
Author :
Klingler, M. ; Rioult, J. ; Ghys, J.-P.
Author_Institution :
INRETS-LEOST, Villeneuve d´´Ascq, France
Abstract :
Emission testing techniques using TEM cells are currently based on power measurements at their port(s) in the frequency-domain. Spectrum measurements do not give directly phase information and therefore only offer partial information on the electromagnetic emission of an equipment under test (EUT) such as the total radiated power. This drawback often leads to difficulties in interpreting the emission results in order to determine precisely the origins of radiation within the EUT and to improve it´s design. This paper presents a new diagnostic method based on time-domain emission measurements using TEM cells in order to determine the origins of radiation within an EUT Unlike spectrum measurements, time-domain measurements can offer full information on radiation, and by correlation with the known currents in the EUT, can help pin-pointing the contributors within the EUT responsible of the highest emission levels.
Keywords :
TEM cells; electromagnetic compatibility; electromagnetic interference; time-domain analysis; EMC; EMI; TEM cells; emission measurements; emission testing techniques; equipment under test; power measurements; time-domain diagnostic method; Conductors; Current measurement; Electromagnetic radiation; Frequency domain analysis; Frequency measurement; Open area test sites; Power measurement; TEM cells; Testing; Time domain analysis;
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
DOI :
10.1109/ISEMC.2002.1032656