DocumentCode
2251924
Title
157 nm lithography for 70 nm technology node
Author
Itani, T.
Author_Institution
Semicond. Leading Edge Technol. Inc., Yokohama, Japan
fYear
2001
fDate
Oct. 31 2001-Nov. 2 2001
Firstpage
306
Lastpage
307
Abstract
157 nm lithography is the most promising technology for 70 nm technology node of semiconductor devices. Many efforts have been reported on the exposure tool, the laser, the resist materials, the resist processing and the mask materials. In this article, we have demonstrated our recent evaluation results of the exposure tool, the resist materials and processing and the mask materials.
Keywords
masks; photoresists; ultraviolet lithography; 157 nm; 70 nm; VUV lithography; exposure tool; mask material; resist material; resist processing; semiconductor device manufacturing; Lenses; Lithography; Optical films; Optical imaging; Optical materials; Resists; Semiconductor devices; Semiconductor films; Semiconductor lasers; Semiconductor materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2001 International
Conference_Location
Shimane, Japan
Print_ISBN
4-89114-017-8
Type
conf
DOI
10.1109/IMNC.2001.984211
Filename
984211
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