• DocumentCode
    2251924
  • Title

    157 nm lithography for 70 nm technology node

  • Author

    Itani, T.

  • Author_Institution
    Semicond. Leading Edge Technol. Inc., Yokohama, Japan
  • fYear
    2001
  • fDate
    Oct. 31 2001-Nov. 2 2001
  • Firstpage
    306
  • Lastpage
    307
  • Abstract
    157 nm lithography is the most promising technology for 70 nm technology node of semiconductor devices. Many efforts have been reported on the exposure tool, the laser, the resist materials, the resist processing and the mask materials. In this article, we have demonstrated our recent evaluation results of the exposure tool, the resist materials and processing and the mask materials.
  • Keywords
    masks; photoresists; ultraviolet lithography; 157 nm; 70 nm; VUV lithography; exposure tool; mask material; resist material; resist processing; semiconductor device manufacturing; Lenses; Lithography; Optical films; Optical imaging; Optical materials; Resists; Semiconductor devices; Semiconductor films; Semiconductor lasers; Semiconductor materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2001 International
  • Conference_Location
    Shimane, Japan
  • Print_ISBN
    4-89114-017-8
  • Type

    conf

  • DOI
    10.1109/IMNC.2001.984211
  • Filename
    984211