DocumentCode :
2252490
Title :
E3 software verification through the use of statistical process control methods
Author :
Williams, Kimball
Author_Institution :
Underwriters Labs. Inc., Southfield, MI, USA
Volume :
2
fYear :
2002
fDate :
19-23 Aug. 2002
Firstpage :
788
Abstract :
Questions about the validity of measurements made in an E3 laboratory using software to control the instrumentation are a continuing concern for EMC engineers. In previous work, it has been shown that the use of statistical process control (SPC) methods to gage and track the variability of system measurements can provide confidence in the repeatability of the system hardware setup, and in the data it produces. Once the hardware system stability has been demonstrated, it is possible to also utilize SPC historical information to assist in confirming the validity of the data gathered using the system´s control software.
Keywords :
TEM cells; automatic test software; electromagnetic compatibility; electromagnetic interference; program testing; statistical process control; E3 software verification; EMC; EMI; laboratory measurements; measurement repeatability; measurement software; statistical process control methods; system measurements; Control systems; Electromagnetic compatibility; Frequency measurement; Hardware; Instruments; Laboratories; Process control; Road transportation; System performance; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
Type :
conf
DOI :
10.1109/ISEMC.2002.1032694
Filename :
1032694
Link To Document :
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