DocumentCode
2252583
Title
Robustness of classical tuning correlations for proportional-integral controllers
Author
Baab, C.T. ; Latchman, Haniph A. ; Crisalle, Oscar D.
Author_Institution
Dept. of Chem. Eng., Florida Univ., Gainesville, FL, USA
Volume
6
fYear
2003
fDate
4-6 June 2003
Firstpage
4997
Abstract
A formal robustness stability analysis of popular proportional-integral (PI) controller tuning rules for systems approximated by a first-order-plus-time-delay model is proposed. The uncertainty in the process model is represented by multiplicative parametric perturbations in the process gain, process time constant, and process time-delay. The zero-exclusion principle is used to characterize the robustness of the uncertain system in terms of the set of all perturbations that result in stable closed-loops. The robustness results recover the standard gain and phase margin concepts as special cases. In addition, a parametric stability margin is introduced for this class of problems as a generic metric via which alternative PI controller tuning rules may be compared in terms of robustness to simultaneous variations in the all three model parameters. The results of the paper can be applied to several disturbance-rejection and tracking PI tuning rules in widespread use, and permits comparing the tuning rules in terms of their relative robustness. It is shown for example that the integral-square-error tuning rule for disturbance rejection can be destabilized by a 7% simultaneous variation in the system parameters.
Keywords
PI control; closed loop systems; correlation methods; delays; integral equations; stability; tuning; uncertain systems; PI controller; classical tuning correlation; disturbance-rejection; first-order-plus-time-delay model; formal robustness stability analysis; integral-square error tuning rule; multiplicative parametric perturbation; parametric stability margin; phase margin concept; process gain; process time constant; process time-delay; proportional-integral controller; stable closed-loop; system parameter; uncertain system; zero-exclusion principle; Chemical analysis; Chemical engineering; Delay effects; Error correction; Noise robustness; Pi control; Proportional control; Robust control; Robust stability; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 2003. Proceedings of the 2003
ISSN
0743-1619
Print_ISBN
0-7803-7896-2
Type
conf
DOI
10.1109/ACC.2003.1242517
Filename
1242517
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