• DocumentCode
    2252731
  • Title

    Impact of random dopant induced statistical variability on inverter switching trajectories and timing variability

  • Author

    Kamsani, Noor Ain ; Cheng, Binjie ; Roy, Scott ; Asenov, Asen

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Glasgow, Glasgow, UK
  • fYear
    2009
  • fDate
    24-27 May 2009
  • Firstpage
    577
  • Lastpage
    580
  • Abstract
    In this paper we study the effect of statistical variability introduced by random discrete dopants on the dynamic behaviour of an inverter at the 45 nm technology generation using statistical circuit simulation. The impact of the variability on switching trajectories and propagation delay are studied using an inverter chain with differing Fan-Out/Fan-In (FO/FI) ratios.
  • Keywords
    logic circuits; logic gates; statistics; fan-out/fan-in ratios; inverter switching timing variability; inverter switching trajectories variability; random dopant induced statistical variability; statistical circuit simulation; Calibration; Circuit simulation; Circuits and systems; Doping profiles; Inverters; MOSFET circuits; Propagation delay; Semiconductor process modeling; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3827-3
  • Electronic_ISBN
    978-1-4244-3828-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.2009.5117814
  • Filename
    5117814
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2252731