DocumentCode
2252803
Title
On the instability of an electrostatically sprayed liquid jet
Author
Turnbull, Robert J.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear
1990
fDate
7-12 Oct. 1990
Firstpage
783
Abstract
Electrostatic spraying of insulators using field emission or ionization is characterized by the formation of a thin jet. Experimentally, this jet appears to be stable over most of its length. The stability of such a jet is examined theoretically. Since the jet is insulating, the charge injected becomes surface charge. This charge can be redistributed through electric mobility and charge convection. In addition, there is an electric field with a component parallel to the jet. This charge and field result in both a normal and a shearing electrical force. Calculations show that a charge with no tangential field stabilizes the long wavelengths while it makes the short wavelengths more unstable. On the other hand, a tangential electric field stabilizes the short wavelengths. The effect of both charge and the tangential field is much larger than the sum of the two effects separately. Fields and charge densities that are easily achievable in all experiment can be used to produce a stable jet. Calculations of the growth rate of instabilities for different values of the electrical parameters are presented.<>
Keywords
carrier mobility; convection; electric charge; electric fields; electrohydrodynamics; flow instability; insulation; insulators; jets; sprays; charge convection; electric field; electric mobility; electrical force; electrohydrodynamics; electrostatically sprayed liquid jet; field emission; growth rate; instability; insulation; insulators; ionization; surface charge; wavelengths; Dielectric liquids; Dielectrics and electrical insulation; Electrodes; Electrostatics; Ionization; Senior members; Shearing; Spraying; Stability; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 1990., Conference Record of the 1990 IEEE
Conference_Location
Seattle, WA, USA
Print_ISBN
0-87942-553-9
Type
conf
DOI
10.1109/IAS.1990.152275
Filename
152275
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