DocumentCode :
2252803
Title :
On the instability of an electrostatically sprayed liquid jet
Author :
Turnbull, Robert J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear :
1990
fDate :
7-12 Oct. 1990
Firstpage :
783
Abstract :
Electrostatic spraying of insulators using field emission or ionization is characterized by the formation of a thin jet. Experimentally, this jet appears to be stable over most of its length. The stability of such a jet is examined theoretically. Since the jet is insulating, the charge injected becomes surface charge. This charge can be redistributed through electric mobility and charge convection. In addition, there is an electric field with a component parallel to the jet. This charge and field result in both a normal and a shearing electrical force. Calculations show that a charge with no tangential field stabilizes the long wavelengths while it makes the short wavelengths more unstable. On the other hand, a tangential electric field stabilizes the short wavelengths. The effect of both charge and the tangential field is much larger than the sum of the two effects separately. Fields and charge densities that are easily achievable in all experiment can be used to produce a stable jet. Calculations of the growth rate of instabilities for different values of the electrical parameters are presented.<>
Keywords :
carrier mobility; convection; electric charge; electric fields; electrohydrodynamics; flow instability; insulation; insulators; jets; sprays; charge convection; electric field; electric mobility; electrical force; electrohydrodynamics; electrostatically sprayed liquid jet; field emission; growth rate; instability; insulation; insulators; ionization; surface charge; wavelengths; Dielectric liquids; Dielectrics and electrical insulation; Electrodes; Electrostatics; Ionization; Senior members; Shearing; Spraying; Stability; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Society Annual Meeting, 1990., Conference Record of the 1990 IEEE
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-87942-553-9
Type :
conf
DOI :
10.1109/IAS.1990.152275
Filename :
152275
Link To Document :
بازگشت