• DocumentCode
    2252830
  • Title

    Automatic Test Data Generation Based on SA-QGA

  • Author

    Ji, Haijing ; Sun, Junmei

  • Author_Institution
    Sch. of Inf. Sci. & Eng., Hangzhou Normal Univ., Hangzhou, China
  • fYear
    2012
  • fDate
    May 30 2012-June 1 2012
  • Firstpage
    611
  • Lastpage
    615
  • Abstract
    Recently, genetic algorithm and their evolutionary algorithms are widely used on automatic test data generation, but they have many problems such as local optimum, premature convergence and being difficult to find global optimum. This paper proposes a new algorithm: SA-QGA (simulated annealing - quantum generate algorithm), and introduces the Boltzmann mechanism of SA into B_QGA (QGA based on Boltzmann selection mechanism). The SA-QGA is used to generate test data with the excellent computing and global search performance of QGA and local search capability of SA. The experiment result verifies that SA-QGA has good performance on test data generation.
  • Keywords
    automatic test pattern generation; genetic algorithms; program testing; search problems; simulated annealing; Boltzmann selection mechanism; SA-QGA; automatic test data generation; evolutionary algorithms; genetic algorithm; global optimum; global search performance; local search capability; quantum generate algorithm; simulated annealing; Algorithm design and analysis; Biological cells; Convergence; Genetic algorithms; Logic gates; Simulated annealing; Software algorithms; automaticgeneration of test data; genetic algorithm (GA); path test; quantum genetic algorithm (QGA); simulated annealing (SA);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Science (ICIS), 2012 IEEE/ACIS 11th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4673-1536-4
  • Type

    conf

  • DOI
    10.1109/ICIS.2012.37
  • Filename
    6211161