DocumentCode :
2253140
Title :
Wafer level underfill - processing and reliability
Author :
Nguyen, L. ; Nguyen, L. ; Negasi, A. ; Tong, Q. ; Hong, S.H.
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA, USA
fYear :
2002
fDate :
2002
Firstpage :
53
Lastpage :
62
Abstract :
Underfill materials play a major role in the reliability of flip chip packages. These adhesives have been the subject of much research and development in the last few years, and improvement in material performance has been obtained. However, the assembly method still remains unchanged, with the underfill being dispensed at the individual die level after flip chip reflow. Even with the arrival of "no-flow" underfills, assembly still requires depositing the underfill material onto the flip chip site prior to positioning the flip chip die. Processing underfill at the wafer level brings in a new paradigm shift to the area of flip chip packaging. Precoating the wafer with the underfill. will create significant savings in both time and money. The application cycle time of the wafer level process becomes equivalent to one single dispensing operation. This paper will present and discuss the latest results obtained with stencil printing used as the application method for the wafer level process. Several experimental underfill formulations were tested as a function of various printing conditions. With the optimal process conditions, the desired coating thickness can be applied without damage to bumped wafers. Assembly challenges together with reliability data are presented.
Keywords :
adhesives; encapsulation; flip-chip devices; integrated circuit packaging; integrated circuit reliability; printing; adhesives; application cycle time; bumped wafers; coating thickness; dispensing operation; flip chip packages; material performance; printing conditions; reliability; stencil printing; wafer level underfill; wafer precoating; Assembly; Chemicals; Coatings; Curing; Flip chip; Packaging; Printing; Semiconductor materials; Thermal expansion; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2002. IEMT 2002. 27th Annual IEEE/SEMI International
Print_ISBN :
0-7803-7301-4
Type :
conf
DOI :
10.1109/IEMT.2002.1032723
Filename :
1032723
Link To Document :
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