Energy efficient SEU-tolerance in DVS-enabled real-time systems through information redundancy

Author

Ejlali, Alirez ; Schmitz, Marcus T. ; Al-Hashimi, B.M. ; Miremad, Seyed Ghassem ; Rosinger, Paul

Author_Institution

Comput. Eng. Dept., Sharif Univ. of Technol., Tehran, Iran

fYear

2005

fDate

8-10 Aug. 2005

Firstpage

281

Lastpage

286

Abstract

Concerns about the reliability of real-time embedded systems that employ dynamic voltage scaling has recently been highlighted [R. Melhem, D. Mosse, E. Elnozahy (2004), Y. Zhang, K. Chakrabarty (2004) and D. Zhu, R. Melhem, D. Mosse (2004)], focusing on transient-fault-tolerance techniques based on time-redundancy. In this paper we analyze the usage of information redundancy in DVS-enabled systems with the aim of improving both the system tolerance to transient faults as well as the energy consumption. We demonstrate through a case study that it is possible to achieve both higher fault-tolerance and less energy using a combination of information and time redundancy when compared with using time redundancy alone. This even holds despite the impact of the information redundancy hardware overhead and its associated switching activities.

Keywords

embedded systems; energy conservation; fault tolerance; integrated circuit design; integrated circuit testing; low-power electronics; redundancy; DVS-enabled system; dynamic voltage scaling; energy consumption; energy efficiency; information redundancy; real-time embedded system; real-time system; single event upset; time-redundancy; transient-fault-tolerance technique; Dynamic voltage scaling; Embedded system; Energy consumption; Energy efficiency; Fault tolerance; Hardware; Information analysis; Real time systems; Redundancy; Transient analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Low Power Electronics and Design, 2005. ISLPED '05. Proceedings of the 2005 International Symposium on

Print_ISBN

1-59593-137-6

Type

conf

DOI

10.1109/LPE.2005.195528

Filename

1522777