• DocumentCode
    2253479
  • Title

    Improving yield, productivity, and quality in test assembly and packaging through direct part marking and unit level traceability

  • Author

    Agapakis, John ; Figarella, Luis

  • Author_Institution
    RVSI, Canton, MA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    154
  • Lastpage
    158
  • Abstract
    Identifying and tracking individual devices throughout test, assembly and packaging using directly marked 2D data matrix symbols is a viable application and the basis of several SEMI traceability standards. Recently, it has been utilized more extensively in high-volume manufacturing. Advancements such as package-less strip designs make traceability challenges more acute and lead to the development of new methodologies for assembly and test, such as strip testing and mapping. In these applications, 2D symbology marked on lead frames, strips or individual devices provides unit level traceability, prevents mixed lots, and allows defect tracking - ultimately improving yield, productivity and quality. This paper highlights the basic advantages of directly marked 2D data matrix symbols versus conventional 1D bar codes. It describes representative traceability applications in test, assembly and packaging, and the benefits derived from implementation in each business case. A system-level methodology for implementing unit level traceability is presented, including the four basic elements: symbol marking, mark verification, symbol reading and communication of results. Finally, recognizing that a variety of options are often required for effective implementation and integration in a production line, it addresses alternative reading and verification systems ranging from board-level products to intelligent cameras and hand-held readers.
  • Keywords
    fault location; identification technology; integrated circuit packaging; integrated circuit testing; integrated circuit yield; microassembling; quality control; 2D data matrix symbols; 2D symbology; IC assembly; IC test; IC yield; SEMI traceability standards; bar codes; board-level products; defect tracking; device identification; device tracking; direct part marking; hand-held readers; integrated circuit provenance; intelligent cameras; lead frames; mark verification; mixed lots; package-less strip designs; packaging; production line implementation; productivity; quality; reading/verification systems; results communication; strip mapping; strip testing; symbol marking; symbol reading; system-level methodology; traceability applications; unit level traceability; volume manufacturing; Assembly; Databases; Manufacturing processes; Marketing and sales; Packaging; Productivity; Strips; Testing; Transmission line matrix methods; Uninterruptible power systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 2002. IEMT 2002. 27th Annual IEEE/SEMI International
  • Print_ISBN
    0-7803-7301-4
  • Type

    conf

  • DOI
    10.1109/IEMT.2002.1032743
  • Filename
    1032743