• DocumentCode
    2253664
  • Title

    SimTag: Exploiting tag bits similarity to improve the reliability of the data caches

  • Author

    Kim, Jesung ; Kim, Soontae ; Lee, Yebin

  • Author_Institution
    Dept. of Comput. Sci., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    941
  • Lastpage
    944
  • Abstract
    Though tag bits in the data caches are vulnerable to transient errors, few effort has been made to reduce their vulnerability. In this paper, we propose to exploit prevalent same tag bits to improve error protection capability of the tag bits in the data caches. When data are fetched from the main memory, it is checked if adjacent cache lines have the same tag bits as those of the data fetched. This similarity information is stored in the data caches as extra bits to be used later. When an error is detected in the tag bits, the similarity information is used to recover from the error in the tag bits. The proposed scheme has small area, energy, and performance overheads with error protection coverage of 97.9% on average. In contrast, the previously proposed In-Cache Replication scheme is shown to incur large performance and energy overheads.
  • Keywords
    cache storage; SimTag; data caches reliability; error protection capability; in-cache replication scheme; tag bits similarity; Circuit faults; Computer errors; Computer science; Delay; Error correction; Error correction codes; Hardware; Parity check codes; Protection; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5456917
  • Filename
    5456917