DocumentCode
2253664
Title
SimTag: Exploiting tag bits similarity to improve the reliability of the data caches
Author
Kim, Jesung ; Kim, Soontae ; Lee, Yebin
Author_Institution
Dept. of Comput. Sci., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
fYear
2010
fDate
8-12 March 2010
Firstpage
941
Lastpage
944
Abstract
Though tag bits in the data caches are vulnerable to transient errors, few effort has been made to reduce their vulnerability. In this paper, we propose to exploit prevalent same tag bits to improve error protection capability of the tag bits in the data caches. When data are fetched from the main memory, it is checked if adjacent cache lines have the same tag bits as those of the data fetched. This similarity information is stored in the data caches as extra bits to be used later. When an error is detected in the tag bits, the similarity information is used to recover from the error in the tag bits. The proposed scheme has small area, energy, and performance overheads with error protection coverage of 97.9% on average. In contrast, the previously proposed In-Cache Replication scheme is shown to incur large performance and energy overheads.
Keywords
cache storage; SimTag; data caches reliability; error protection capability; in-cache replication scheme; tag bits similarity; Circuit faults; Computer errors; Computer science; Delay; Error correction; Error correction codes; Hardware; Parity check codes; Protection; Redundancy;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5456917
Filename
5456917
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