DocumentCode :
2253773
Title :
Reliability-availability-serviceability characteristics of a compressed-memory system
Author :
Chen, Jim ; Har, David ; Mak, Ken ; Schulz, Charles ; Tremaine, Brett ; Wazlowski, Mike
Author_Institution :
Global Hardware Dev. Div., IBM Corp., Poughkeepsie, NY, USA
fYear :
2000
fDate :
2000
Firstpage :
163
Lastpage :
168
Abstract :
New compression innovations and high-density silicon technology enable us to introduce main-memory compression. This technology is able to achieve, in most cases, 2:1 or better compression without impacting performance. It provides an enormous cost/performance advantage, given the cost content of memory in modern enterprise servers. The complex and highly parallel data manipulations central to this compression implementation would, if unprotected by extensive error detection and error correction techniques, offer several potential data integrity exposures. This paper describes the memory subsystem of an enterprise class server with a compressed mainstore and the methods which have been employed to guarantee the integrity of the compressed data. These methods consist of a novel ECC algorithm which includes address information in the code words, the use of CRC codes for compressed data blocks, and various consistency checks on the memory management structures used in the management of a compressed mainstore
Keywords :
data integrity; error correction; error detection; fault tolerant computing; storage management; address information; compressed-memory system; data integrity; enterprise class server; enterprise servers; error correction; error detection; high-density silicon technology; highly parallel data manipulations; main-memory compression; memory management structures; reliability-availability-serviceability characteristics; Communication channels; Control systems; Cyclic redundancy check; Error correction; Fault detection; Hardware; Operating systems; Read only memory; Read-write memory; System buses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependable Systems and Networks, 2000. DSN 2000. Proceedings International Conference on
Conference_Location :
New York, NY
Print_ISBN :
0-7695-0707-7
Type :
conf
DOI :
10.1109/ICDSN.2000.857530
Filename :
857530
Link To Document :
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