DocumentCode
2253792
Title
Ultrasonic bonding of In/Au and Al/Al for hermetic sealing of MEMS packaging
Author
Jongbaeg Kim ; Mu Chiao ; Liwei Lin
Author_Institution
Dept. of Mech. Eng., California Univ., Berkeley, CA, USA
fYear
2002
fDate
24-24 Jan. 2002
Firstpage
415
Lastpage
418
Abstract
In this paper the feasibility of ultrasonic bonding for hermetic MEMS packaging has been demonstrated for the first time adopting two different sets of materials; indium-to-gold and aluminum-to-aluminum. The process utilizes purely mechanical vibration energy and enables low temperature bonding between similar or dissimilar materials without precleaning of the bonding surfaces. As such, ultrasonic bonding can be broadly applied not only for electrical interconnection, but also for hermetic MEMS sealing and packaging especially where temperature limitation is a critical issue. This paper describes the ultrasonic bonding and hermetic sealing processes as well as the bonding tool characterization and equipment setups.
Keywords
aluminium; gold; indium; micromechanical devices; packaging; seals (stoppers); ultrasonic bonding; Al-Al; In-Au; MEMS packaging; electrical interconnection; hermetic sealing; low temperature bonding; mechanical vibration energy; ultrasonic bonding; Bonding processes; Diffusion bonding; Gold; Micromechanical devices; Packaging; Power control; Surface contamination; Temperature; Ultrasonic transducers; Welding;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2002. The Fifteenth IEEE International Conference on
Conference_Location
Las Vegas, NV, USA
ISSN
1084-6999
Print_ISBN
0-7803-7185-2
Type
conf
DOI
10.1109/MEMSYS.2002.984291
Filename
984291
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