• DocumentCode
    2253792
  • Title

    Ultrasonic bonding of In/Au and Al/Al for hermetic sealing of MEMS packaging

  • Author

    Jongbaeg Kim ; Mu Chiao ; Liwei Lin

  • Author_Institution
    Dept. of Mech. Eng., California Univ., Berkeley, CA, USA
  • fYear
    2002
  • fDate
    24-24 Jan. 2002
  • Firstpage
    415
  • Lastpage
    418
  • Abstract
    In this paper the feasibility of ultrasonic bonding for hermetic MEMS packaging has been demonstrated for the first time adopting two different sets of materials; indium-to-gold and aluminum-to-aluminum. The process utilizes purely mechanical vibration energy and enables low temperature bonding between similar or dissimilar materials without precleaning of the bonding surfaces. As such, ultrasonic bonding can be broadly applied not only for electrical interconnection, but also for hermetic MEMS sealing and packaging especially where temperature limitation is a critical issue. This paper describes the ultrasonic bonding and hermetic sealing processes as well as the bonding tool characterization and equipment setups.
  • Keywords
    aluminium; gold; indium; micromechanical devices; packaging; seals (stoppers); ultrasonic bonding; Al-Al; In-Au; MEMS packaging; electrical interconnection; hermetic sealing; low temperature bonding; mechanical vibration energy; ultrasonic bonding; Bonding processes; Diffusion bonding; Gold; Micromechanical devices; Packaging; Power control; Surface contamination; Temperature; Ultrasonic transducers; Welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2002. The Fifteenth IEEE International Conference on
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-7185-2
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2002.984291
  • Filename
    984291