• DocumentCode
    2253936
  • Title

    Devices for fatigue testing of electroplated nickel (MEMS)

  • Author

    Larsen, K.P. ; Ravnkilde, J.T. ; Ginnerup, M. ; Hansen, O.

  • Author_Institution
    MIC, Tech. Univ. Denmark, Lyngby, Denmark
  • fYear
    2002
  • fDate
    24-24 Jan. 2002
  • Firstpage
    443
  • Lastpage
    446
  • Abstract
    In-situ fatigue test devices with integrated electrostatic actuator were fabricated in electroplated nanocrystalline nickel (nano-nickel). The devices feature in-plane approximately pure bending with fixed displacement of the test specimen of the dimensions: widths from 2/spl mu/m to 3.7/spl mu/m, a height of 7/spl mu/m and an effective length from 4/spl mu/m to 27/spl mu/m. Maximum stresses of the test beam were calculated to be 500MPa to 2100MPa by use of FEM tools. The test results indicate very promising fatigue properties of nano-nickel, as none of the test devices have shown fatigue failure or even initiation of cracks after 10/sup 8/ cycles. The combination of high strength and toughness, which is known for nanocrystalline materials, together with very small test specimens and low surface roughness could be the explanation for the good fatigue properties.
  • Keywords
    bending; electroplated coatings; electrostatic actuators; fatigue testing; finite element analysis; nanostructured materials; nickel; FEM; MEMS material; Ni; beam stress; bending; electroplated nanocrystalline nickel; electrostatic actuator; fatigue testing; surface roughness; Electrostatic actuators; Fatigue; Materials testing; Micromechanical devices; Nanoscale devices; Nanostructured materials; Nickel; Rough surfaces; Stress; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2002. The Fifteenth IEEE International Conference on
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-7185-2
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2002.984298
  • Filename
    984298