Title :
Sensitivity analysis for system design improvement
Author :
Contini, Sergio ; Scheer, Stefan ; Wilikens, Marc
Author_Institution :
Inst. for Syst., Inf. & Safety, Joint Res. Centre, Ispra, Italy
Abstract :
In order to help identify suitable design modifications for complex systems, there is a need to (1) determine the weakest elements of the system, (2) identify a better design alternative, and (3) evaluate the effect of the adopted solution on system safety/availability. This is a well-known procedure that is applied to a single system failure mode. In reality, several undesired system states have to be checked for. On the other hand, systems grow in complexity, and components are often multi-functional, so that they could affect several system states concurrently, and even in conflicting terms. This paper presents the sensitivity analysis module of the ASTRA (Advanced Software Tools for Reliability Analysis) package, based on component importance analysis techniques to be applied to all system failure states concurrently. The technique employs fault-tree analysis and Markov processes as the basic probabilistic models
Keywords :
Markov processes; computer aided software engineering; fault trees; large-scale systems; sensitivity analysis; software reliability; subroutines; systems analysis; ASTRA package; Advanced Software Tools for Reliability Analysis; Markov processes; complex systems; component importance analysis techniques; concurrent application; conflicts; design alternatives; design modifications identification; fault-tree analysis; multi-functional components; probabilistic models; sensitivity analysis; system availability; system design improvement; system failure mode; system failure states; system safety; undesired system state checking; weakest elements; Availability; Binary decision diagrams; Failure analysis; Fault trees; Informatics; Safety; Sensitivity analysis; Software tools; System analysis and design; US Department of Transportation;
Conference_Titel :
Dependable Systems and Networks, 2000. DSN 2000. Proceedings International Conference on
Conference_Location :
New York, NY
Print_ISBN :
0-7695-0707-7
DOI :
10.1109/ICDSN.2000.857545