Title :
Robustness testing of the Microsoft Win32 API
Author :
Shelton, Charles P. ; Koopman, Philip ; Devale, Kobey
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
Although Microsoft Windows is being deployed in mission-critical applications, little quantitative data has been published about its robustness. We present the results of executing over two million Ballista-generated exception handling tests across 237 functions and system calls involving six Windows variants, as well as similar tests conducted on the Linux operating system. Windows 95, Windows 98 and Windows CE were found to be vulnerable to complete system crashes caused by very simple C programs for several different functions. No system crashes were observed on Windows NT, Windows 2000 or Linux. Linux was significantly more graceful at handling exceptions from system calls in a program-recoverable manner than Windows NT and Windows 2000, but those Windows variants were more robust than Linux (with glibc) at handling C library exceptions. While the choice of operating systems cannot be made solely on the basis of one set of tests, it is hoped that such results will form a starting point for comparing dependability across heterogeneous platforms
Keywords :
application program interfaces; exception handling; microcomputer applications; operating systems (computers); program testing; software libraries; software reliability; Ballista-generated exception handling tests; C library exceptions; C programs; Linux; Microsoft Win32 API; Microsoft Windows; dependability; glibc; heterogeneous platforms; mission-critical applications; operating systems; program-recoverable exception handling; robustness testing; system calls; system crashes; Computer crashes; Ice; Libraries; Linux; Mission critical systems; Operating systems; Robustness; System testing; Vehicle crash testing;
Conference_Titel :
Dependable Systems and Networks, 2000. DSN 2000. Proceedings International Conference on
Conference_Location :
New York, NY
Print_ISBN :
0-7695-0707-7
DOI :
10.1109/ICDSN.2000.857548